Unraveling Material Properties with Advanced Nanoscale Characterization

Understanding the properties of micro- and nanodevices is essential for their development, and our characterization services at the Kavli Nanolab utilize tools like SEM, AFM, and advanced spectroscopy to provide unparalleled insights.

Scanning Electron Microscopy (SEM) delivers high-resolution imaging, capturing surface details at magnifications up to 2,000,000x. It is critical for analyzing nanostructures like graphene flakes or nanowire arrays, identifying defects such as cracks or impurities. In microelectronics, SEM measures feature sizes in transistors, ensuring design fidelity.

Atomic Force Microscopy (AFM) complements SEM by probing surface properties at the atomic level. Using a cantilever with a nanoscale tip, it maps topography, elasticity, and conductivity, ideal for characterizing soft materials like polymers or biological samples. For instance, AFM quantifies the stiffness of thin films used in flexible displays, guiding material selection.

Spectroscopy techniques, such as Energy-Dispersive X-ray Spectroscopy (EDS) and Photoluminescence (PL), provide chemical and optical insights. EDS identifies elemental composition in multilayer devices, while PL measures emission properties in quantum dots, critical for display technologies. Our multimodal approach combines these methods for comprehensive analysis.

In a recent project, we used SEM and AFM to characterize a nanomembrane for filtration, optimizing pore size and mechanical strength. Our reports include quantitative data, such as surface roughness (RMS < 1 nm) or bandgap values, supported by statistical validation.

Our consultation services design tailored characterization plans, addressing challenges like material degradation or interface mismatches. As techniques like cryogenic SEM emerge, our facility remains a leader, delivering data that fuels innovation.