Comprehensive Characterization for Unlocking Material and Device Potential

Characterization is the cornerstone of nanotechnology, providing critical insights into the properties and performance of materials and devices. At the Kavli Nanolab, we employ advanced tools like Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), and spectroscopy to deliver detailed analyses that drive innovation.

SEM utilizes a high-energy electron beam to produce images with resolutions down to 1 nanometer, revealing surface morphology and composition. It is indispensable for inspecting nanostructures, such as carbon nanotubes or 2D materials, identifying defects like pinholes or phase segregation. In semiconductor manufacturing, SEM verifies critical dimensions of gate structures, ensuring compliance with design tolerances.

AFM provides complementary data by mapping surface topography and mechanical properties at the atomic scale. Operating in dynamic modes, it measures forces between a nanoscale probe and the sample, yielding information on stiffness, adhesion, and electrical properties. This is particularly valuable for characterizing soft materials, such as hydrogels used in tissue engineering, where traditional imaging may cause deformation.

Spectroscopy techniques, including Raman, X-ray Photoelectron Spectroscopy (XPS), and UV-Vis, probe chemical and electronic characteristics. Raman spectroscopy maps vibrational modes, enabling stress analysis in graphene or phase identification in perovskites. XPS quantifies surface chemistry, critical for understanding interface reactions in batteries. UV-Vis measures optical properties, guiding the development of photonic devices like waveguides.

Our characterization services combine these techniques for a comprehensive understanding of materials. For instance, in solar cell research, we use SEM to assess electrode morphology, AFM to measure surface roughness, and XPS to analyze doping profiles, optimizing efficiency. Our reports provide quantitative metrics, such as bandgap energies or surface energy, backed by statistical analysis for reliability.

We also offer tailored consultation, designing characterization protocols to address specific challenges, such as optimizing thin-film deposition or validating quantum dot synthesis. By leveraging the research ecosystem of TU Delft, we deliver insights that accelerate development and enhance device performance.

Future advancements, like correlative microscopy combining SEM and AFM, will further refine our capabilities. Our services ensure clients remain ahead of the curve, turning data into actionable innovation.