Advanced Surface Characterization of Solid-State Materials Using Atomic Force Microscopy

This study introduces a sophisticated approach to surface characterization of solid-state materials, with a focus on graphene-based mechanical and electronic devices, utilizing atomic force microscopy (AFM). By optimizing AFM techniques, we achieve high-resolution mapping of surface topography, mechanical properties, and electronic characteristics of materials, including suspended graphene and in-situ grown graphene/boron nitride heterostructures. Our method enables precise detection of nanoscale features, such as surface roughness, defects, and layer interactions, providing critical insights into material performance. The approach is highly adaptable, supporting the development of advanced nanoelectronic and nanomechanical systems. This work establishes AFM as a powerful tool for characterizing 2D materials, with applications in quantum electronics, flexible devices, and heterostructure engineering.