Advanced Visualization and Quantification of Sub-Micrometer Cracks in 2D Materials Using Fluorescence Quenching Microscopy

This research presents a novel technique for the visualization and quantitative analysis of sub-micrometer cracks in 2D materials, leveraging fluorescence quenching microscopy (FQM). Compared to conventional optical microscopy and scanning electron microscopy (SEM), our FQM-based approach offers superior contrast and sensitivity for detecting nanoscale defects in materials such as graphene. By introducing a rupture index, we provide a quantitative metric to assess crack density and severity, enabling precise characterization of material integrity. The method demonstrates enhanced resolution and accuracy, making it ideal for studying the mechanical stability of 2D materials. This technique is scalable and adaptable, offering significant potential for quality control in the production of 2D material-based devices, including nanoelectronics, sensors, and flexible displays.