Characterization

In-Depth Analysis and Evaluation

We provide advanced characterization services to analyze materials and devices down to the nanoscale, using:

• Scanning Electron Microscopy (SEM)
• Atomic Force Microscopy (AFM)
• Raman Spectroscopy
• Optical and fluorescence microscopy
• OX-ray scattering and ellipsometry

Our expertise ensures detailed insight into the mechanical, electronic, and chemical properties of your materials and devices.